By Gerd Kaupp
Making a transparent contrast is made among nano- and micro-mechanical checking out for actual purposes, this monograph describes the fundamentals and purposes of the supermicroscopies AFM and SNOM, and of the nanomechanical trying out on tough and technical normal surfaces within the submicron diversity right down to a lateral answer of some nm. New or more advantageous instrumentation, new actual legislation and unexpected new functions in all branches of typical sciences (around physics, chemistry, mineralogy, fabrics technological know-how, biology and medication) and nanotechnology are lined in addition to the assets for pitfalls and blunders. It outlines the dealing with of ordinary and technical samples with regards to these of flat usual samples and emphasizes new designated good points. Pitfalls and resources of error are in actual fact established in addition to their effective treatment while going from molecularly flat to tough surfaces. the tutorial or business scientist learns the way to observe the foundations for tackling their medical or production initiatives that come with roughness distant from commonplace samples.
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Extra resources for Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology) by Gerd Kaupp